The vendor is required to provide on behalf of the Metallurgical Engineering Department is seeking a atomic force microscope (AFM) system supplier.
- Nanometer scale features at mineral surfaces are important for fundamental understanding of surface chemistry phenomena in mineral processing and hydrometallurgy.
- This research team has extensive experience using AFM for surface imaging and analysis and force measurement in air or liquid environment
- The AFM system needs to be able to hold small and medium size (maximum size of 40mm x 40mm x 20mm) samples with the maximum XYX stage travel range of 20mm x 20mm x 20mm at a step size below 100 nm.
- The vision camera at 10x objective lens, the field of view must be at least 0.8mm x 0.6mm.
- The XY scanning range must be at least 100um x 100um.
- The AFM image size can be as large as 4k x 4k.
- The scanning mode needs to include contact mode, non-contact mode, tapping mode, and force and distance measurement
- The AFM system can perform scanning tunnelling microscopy
- System must contain liquid cell functionality.
- System must have the capability of running conductive-AFM.
- The instrument should have an upgradability to scanning electrochemical cell microscopy.
- Vendor must offer one year warranty.
- Vendor must include in person training.
- Vendor must install system.
- Questions/Inquires Deadline: March 10, 2025