The Vendor is required to provide for an electrochemical atomic force microscopy system.
- Services include:
• Scan range of at least 25 μm in x and y dimensions and 5 μm in z dimension on closed loop.
• Maximum scan rate above 35 HZ and scan rates of at least 20 HZ in tapping mode, contact mode, electrostatic force microscopy, kelvin probe force microscopy, lateral force mode, magnetic force microscopy, piezo response force microscopy, and temperatures ranging from 0°c to 120°c.
• Laser diode source with 850 nm and 10x30 μm spot size with motorized spot positioning.
• Both piezo and photo thermal drive for cantilever oscillation with a drive frequency exceeding 6.5 MHz for both cantilever drive option.
• Photo thermal spot size of 5 μm or less in diameter.
• Piezo and photo thermal drive capabilities must both be suitable for analyzing gas and liquid environments.
• On-Surface noise of less than 15 pm as measured with a 1 kHz bandwidth over 10 seconds at center of the scanner range.
• Electrochemistry cell with perfusion, where the cell is fully sealed from the external environment, able to exchange gas or liquid above the sample surface, a liquid volume of less than 20 μL, and pressure of less than 5 pounds per square inch measured with an internal pressure sensor.
• Temperature control with a range from 0°c to 120°c that is suitable for both gas and liquid environments with ability to program temperature ramp and hold cycles.
• Optical field of view greater than 600x800 μm with numerical aperture greater than 0.45.
• Acoustic enclosure to provide 20 DB isolation.
• Active vibration isolation, with active isolation 1.2 HZ up to 200 HZ and passive isolation for greater than 200 HZ.
• The system must include hardware and software for the following modes: tapping mode (AC) in gas and liquid, tapping mode with digital q control, contact mode in gas and liquid, frequency modulation, lateral force mode, phase imaging, bimodal dual ac, dual ac resonance tracking, force mapping mode, loss tangent imaging, force curves, force modulation, piezo response force microscopy (PFM), dual ac resonance tracking PFM, switching spectroscopy PFM, vector PFM, kelvin probe force microscopy (scanning KPFM), electrostatic force microscopy, magnetic force microscopy, nanolithography, nanomanipulation, AMFM viscoelastic mapping, contact resonance viscoelastic mapping, electrochemistry, conductive AFM, AFM in liquids, scanning tunneling microscopy (STM).
• Equipment manual must be provided – electronic preferred.
• Installation and startup assistance must be provided. 
• Installation date and details must be coordinated with Prof. Company.
• Lab personnel training and familiarization must be provided at installation.