The Vendor is required to provide to acquire an electron channeling contrast imaging (ECCI)-capable ultrahigh-resolution field emission scanning electron microscope (FE-SEM) for the nanoscale characterization of geomaterials.
- The requested FE-SEM must generate high-resolution analytical electron micrographs of prepared rock thin sections, with key requirements including the capability for Selected Area Electron Channeling Pattern (ECP) formation through beam rocking for selecting optimal beam conditions to capture quantitative electron channeling contrast images of rock samples.
- The microscope must integrate correlative analysis systems, enabling simultaneous acquisition using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-ray Spectroscopy (EDS/EDX) to support the development of innovative analytical approaches for investigating structural and chemical processes in minerals across multiple length scales.
- Contract Period/Term: 4 years
- Questions/Inquires Deadline: May 19, 2025